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Related Experiment Video

Updated: May 27, 2025

$Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples$

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Exploiting commercial micro X-ray fluorescence systems for stereoscopic soft X-ray imaging.

Ricardo Baettig¹, Ben Ingram², Ricardo A Cabeza³

¹Facultad de Ciencias Forestales y de la Conservación de la Naturaleza, Universidad de Chile, La Pintana, Santiago, Chile.

Journal of X-Ray Science and Technology

|February 20, 2025

Summary

Commercial micro X-ray fluorescence (μXRF) systems can now create 3D chemical maps by exploiting beam misalignment for X-ray stereoscopy. This technique accurately reconstructs metal and void configurations in materials without system modification.

Keywords:

X-rays X-rays stereoscopic vision Z-backscattering compton scatter imaging micro X-ray fluorescence

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Last Updated: May 27, 2025

$Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples$

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

X-ray Dose Reduction through Adaptive Exposure in Fluoroscopic Imaging

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Published on: September 11, 2011

High Resolution 3D Imaging of Ex-Vivo Biological Samples by Micro CT

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Published on: June 21, 2011

Area of Science:

Materials Science
Analytical Chemistry
Imaging Techniques

Background:

Commercial micro X-ray fluorescence (μXRF) systems often have beam misalignment, hindering spatial correlation.
This misalignment is usually seen as a disadvantage, limiting elemental information accuracy.

Purpose of the Study:

To demonstrate 3D configuration estimation of metals and voids in polymethyl methacrylate using commercial μXRF.
To explore enhancing μXRF mapping techniques for non-destructive 3D chemical analysis.

Main Methods:

Utilized unmodified commercial μXRF equipment for quantitative reconstruction.
Leveraged X-ray fluorescence (XRF) and Compton scattering effects.
Examined beam divergence impact on deeper object acutance.

Main Results:

Successfully reconstructed size, position, and depth of embedded tungsten, copper, and silver objects.
Depth estimation bias ranged from 4% to 15% for depths up to 24 mm.
Size estimation bias was below 3.2%.

Conclusions:

Demonstrated that μXRF beam inclination-induced misalignment can be used for 3D imaging.
Validated a robust methodology applicable to various samples with minimal μXRF system modifications.
Established a foundation for advancing μXRF mapping and interpretation for broader scientific applications.