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Thermal biasing for lattice symmetry breaking and topological edge state imaging
Dohyun Kim1, Jaeuk Seo1, Sangsu Yer1
1Department of Physics, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea.
Abstract:
Marginally twisted bilayer graphene with large Bernal stacked domains involves symmetry-breaking features with domain boundaries that exhibit topological edge states normally obscured by trivial bands. A vertical electric field can activate these edge states through inversion symmetry breaking and opening a bandgap around the edge state energy. However, harnessing pristine topological states at the Fermi level without violent electric or magnetic bias remains challenging, particularly above room temperature. Here, we demonstrate that thermal biasing can break the vertically stacked lattice symmetry of twisted bilayer graphene via the interatomic Seebeck effect, enabling thermoelectric imaging of topological edge states at tunable Fermi levels above room temperature. The high spatial resolution in the imaging is achieved through atomic-scale thermopower generation between a metallic tip and the sample, reflecting the local electronic band structure and its derivative features of twisted bilayer graphene at the Fermi level. Our findings suggest that thermal biasing provides a sensitive, non-destructive method for symmetry breaking and topological state imaging above room temperature, making it a practical and accessible approach.
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