Revisiting the Formulation of Charged Defect in Solids

Hanzhi Shang1, Zeyu Jiang1, Yiyang Sun1

  • 1Rensselaer Polytechnic Institute, Department of Physics, Applied Physics and Astronomy, Troy, New York 12180, USA.

Physical Review Letters
|February 28, 2025
PubMed
Summary

Accurate defect formation energies in microelectronics are achieved by refining total energy calculations. This study demonstrates that potential alignment corrections are unnecessary, and Makov-Payne corrections provide precise results for defect physics.

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