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Revisiting the Formulation of Charged Defect in Solids
Hanzhi Shang1, Zeyu Jiang1, Yiyang Sun1
1Rensselaer Polytechnic Institute, Department of Physics, Applied Physics and Astronomy, Troy, New York 12180, USA.
Accurate defect formation energies in microelectronics are achieved by refining total energy calculations. This study demonstrates that potential alignment corrections are unnecessary, and Makov-Payne corrections provide precise results for defect physics.
Area of Science:
- Solid State Physics
- Materials Science
- Computational Materials Science
Background:
- Defect physics is crucial for understanding microelectronic material properties.
- Accurate calculation of defect formation energies is essential for predicting material behavior.
- Existing methods for calculating defect formation energies often require complex corrections.
Purpose of the Study:
- To re-evaluate and simplify corrections in total energy calculations for defect physics.
- To formulate an accurate expression for quadrupole corrections using linear response theory.
- To demonstrate accurate formation energy calculations for various defects, including those in anisotropic materials.
Main Methods:
- Utilizing total energy calculations with careful tracking of reference energy.
- Applying linear response theory to derive quadrupole corrections.
- Testing the methods on diverse defects, including the 2+ diamond vacancy.
Main Results:
- The "potential alignment" correction in total energy calculations was shown to vanish.
- The classic Makov-Payne correction was confirmed to yield accurate results.
- An accurate expression for the quadrupole correction was formulated.
- Accurate formation energies were obtained for numerous defects in small supercells.
- The slow convergence for the 2+ diamond vacancy was attributed to size-dependent dielectric constants arising from slowly varying gap levels.
Conclusions:
- Refined total energy calculations simplify defect physics.
- The Makov-Payne correction and a new quadrupole correction provide accurate defect formation energies.
- Understanding defect-induced dielectric constant variations is key for convergence in specific cases.
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