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Published on: December 5, 2015
Contact Resistance Optimization in MoS2 Field-Effect Transistors through Reverse Sputtering-Induced Structural
Yuan Fa1,2, Agata Piacentini1,2, Bart Macco3
1AMO GmbH, Advanced Microelectronic Center Aachen, Otto-Blumenthal-Str. 25, 52074 Aachen, Germany.
Reverse sputtering significantly reduces contact resistance in molybdenum disulfide field-effect transistors (MoS2-FETs) by forming conductive 1T-MoS2. This enhances transistor performance, paving the way for advanced 2D material electronics.
Area of Science:
- Materials Science
- Solid State Physics
- Nanotechnology
Background:
- Two-dimensional material (2DM)-based field-effect transistors (FETs) are promising for extending Moore's Law due to their potential for ultrashort channels.
- Molybdenum disulfide (MoS2)-FETs suffer from high contact resistance (Rc) caused by Schottky barriers at the metal-MoS2 interface, limiting ON-state currents.
Purpose of the Study:
- To investigate the modification of MoS2 to reduce contact resistance in MoS2-FETs.
- To explore the formation of conductive 1T-MoS2 at the metal-MoS2 interface using reverse sputtering.
Main Methods:
- Utilized reverse sputtering technique to modify the MoS2 surface at the metal-MoS2 interface.
- Fabricated and characterized MoS2-FETs before and after the reverse sputtering treatment.
Main Results:
- Optimized reverse sputtering conditions reduced Rc by over 50% compared to untreated MoS2-FETs.
- The treatment induced the formation of conductive 1T-MoS2 at the contact interface.
- Improved electrical characteristics, including higher ON-state currents, were observed in treated MoS2-FETs.
Conclusions:
- Reverse sputtering is an effective method for mitigating Schottky barriers and reducing contact resistance in MoS2-FETs.
- This standard semiconductor process offers a viable route for enhancing the performance of 2DM-based microelectronic devices and circuits.
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