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Positron stopping in multilayer materials.

A C L Jones1, T Chung1, F A Selim1

  • 1Materials Science and Engineering-School for Engineering of Matter, Transport & Energy, ASU, Tempe, AZ, United States of America.

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|March 13, 2025
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Summary
This summary is machine-generated.

This study introduces a new analytical method for determining positron stopping profiles in multilayer materials, moving beyond complex Monte Carlo simulations. The approach accurately predicts positron implantation depth in layered systems.

Keywords:
Monte Carlodefect characterizationimplantationmultilayerpositronpositron annihilation spectroscopy

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Area of Science:

  • Materials Science
  • Physics
  • Surface Science

Background:

  • Positron annihilation spectroscopy is crucial for defect characterization.
  • Established methods for single-layer targets are insufficient for multilayer systems.
  • Monte Carlo simulations are the current standard for multilayer positron stopping profiles.

Purpose of the Study:

  • To develop an alternative analytical approach for positron stopping profiles in multilayer targets.
  • To provide a more accessible method compared to complex simulations.
  • To accurately model positron interactions within layered materials.

Main Methods:

  • Developed an analytical model estimating positron energy distribution (dN/dE) after each layer.
  • Utilized a basis set of calculated stopping profiles for fitting.
  • Summed stopping profiles in subsequent layers based on the derived energy distribution.
  • Validated the model against Monte Carlo simulations for Al/Au multilayer systems.

Main Results:

  • The model shows reasonable agreement with Monte Carlo simulations for positron profiles in Al/Au multilayers.
  • Excellent agreement was achieved in predicting the mean implantation depth.
  • A simplified formula for mean implantation depth in two-layer systems was derived with high accuracy.

Conclusions:

  • The proposed analytical method offers a viable alternative to Monte Carlo simulations for multilayer positron stopping profiles.
  • The model accurately predicts positron implantation behavior in layered materials.
  • A simplified formula provides a quick and accurate estimation of mean implantation depth in two-layer systems.