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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
1Department of Electrical Engineering, City University of Hong Kong, Tat Chee Avenue, Kowloon, Hong Kong SAR 999077, China.
This study re-evaluates the working principles of molybdenum disulfide (MoS2) memtransistors. It proposes a more accurate physical model for their memory characteristics, impacting neuromorphic computing device development.
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