Calibration of the lateral spring constant for a custom T-shaped atomic force microscopy probe

Zhimu Yang1, Rui Xu1, Dongchao Zhao1

  • 1Jiangsu Key Laboratory for Design and Manufacture of Micro-Nano Biomedical Instruments, Department of Mechanical Engineering, Southeast University, Nanjing 210096, People's Republic of China.

Summary

This study presents a new method to calibrate the lateral spring constant of atomic force microscopy (AFM) probes. The technique accurately determines this critical nanotribology parameter using resonance frequencies and probe mass reduction.