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Measurement of in-plane thermal diffusivity of thin film using a regression methodology based on Bayesian

Maochao Lv1, Qinmeng Jiang2, Hui Liu1

  • 1School of Information and Control Engineering, China University of Mining and Technology, Xuzhou 221008, China.

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Summary

This study introduces a new Bayesian optimization method for measuring thin film thermal diffusivity. It bypasses complex infrared cameras by directly analyzing thermal images, offering a simpler, robust characterization technique.

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Area of Science:

  • Materials Science
  • Thermal Physics
  • Nanotechnology

Background:

  • Lock-in thermography is a standard method for determining thermal properties of films.
  • High phase detection accuracy in lock-in thermography often necessitates advanced infrared (IR) cameras.
  • Conventional methods treat amplitude and phase as intermediate values, requiring complex algorithms.

Purpose of the Study:

  • To develop a regression methodology using Bayesian optimization for determining in-plane thermal diffusivity of thin films.
  • To present an alternative to conventional lock-in algorithms that directly uses time-sequential thermograms.
  • To reduce system requirements for accurate thermal property characterization.

Main Methods:

  • A regression methodology based on Bayesian optimization is proposed.
  • The method directly incorporates time-sequential thermograms into the regression process, bypassing intermediate amplitude and phase calculations.
  • Thermal diffusivity and phase offset are extracted by minimizing the mean absolute error between measured and simulated normalized temperatures.

Main Results:

  • Accurate in-plane thermal diffusivity was determined using only a few thermograms per modulation period.
  • The method was validated on a stainless-steel film, showing robust performance.
  • The approach demonstrated reduced system requirements compared to traditional methods.

Conclusions:

  • The proposed Bayesian optimization method offers a feasible and robust alternative for determining thin film thermal diffusivity.
  • This approach simplifies the experimental setup by not requiring sophisticated IR cameras for high phase accuracy.
  • The technique shows promise for characterizing complex materials like composite films and advanced thermal interfacial materials.