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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
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The probability of having two carbon-13 atoms next to each other is negligible because of the low natural abundance of carbon-13. Consequently, peak splitting due to carbon-carbon spin-spin coupling is not observed in spectra. However, protons up to three sigma bonds away split the carbon signal according to the n+1 rule, resulting in complicated spectra.
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When magnetic nuclei in a sample achieve resonance and undergo relaxation, the signal detected in NMR is an approximately exponential free induction decay. Fourier transform of an exponential decay yields a Lorentzian peak in the frequency domain. Lorentzian peaks in an NMR spectrum are defined by their amplitude, full width at half maximum, and position, where the peak width is governed by the spin-spin relaxation time alone. In real experiments, however, the applied magnetic field is rendered...
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In atomic emission spectroscopy (AES), high-temperature atomizers excite a broad range of elements and molecules that generate complex emissions from sources such as oxides, hydroxides, and flame combustion products in the flame or plasma. Several strategies can be employed to minimize spectral interferences caused by overlapping emission lines or bands. These include increasing instrument resolution, choosing alternative emission lines, optimally placing the detector in low-background regions,...
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Spin systems where the difference in chemical shifts of the coupled nuclei is greater than ten times J are called first-order spin systems. These nuclei are weakly coupled, and their chemical shifts and coupling constant can generally be estimated from the well-separated signals in the spectrum.
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Splicing dual-range EELS spectra: Identifying and correcting artefacts.

Alan J Craven1, Bianca Sala2, Donald A MacLaren1

  • 1SUPA School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK.

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Summary

Artefacts in electron energy loss spectroscopy (EELS) splicing are corrected using new methods. This improves quantitative analysis of EELS data, even after system changes.

Keywords:
Artefact correctionDirect electron detectorsDual EELSElectron energy loss spectroscopy

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Area of Science:

  • Materials Science
  • Spectroscopy
  • Electron Microscopy

Background:

  • Electron Energy Loss Spectroscopy (EELS) requires splicing low and core loss spectra for full range analysis.
  • Large dynamic range in EELS leads to small intensities at splice points, amplifying artefact effects.

Purpose of the Study:

  • Investigate and correct artefacts in EELS data splicing.
  • Improve quantitative accuracy in EELS analysis, particularly in Gatan GIF Quantum systems.

Main Methods:

  • Identified three main artefact sources: spectrometer optical aberrations, detector stray scattering, and detector quadrant responsivity differences.
  • Developed methods to measure, quantify, and correct these specific artefacts.
  • Validated correction by comparing scaling factors before and after correction.

Main Results:

  • Artefacts caused scaling factors to deviate by ~15% and depend on specimen thickness.
  • Post-correction, discrepancies in scaling factors were reduced to <0.5%.
  • Demonstrated the ability to quantitatively compare EELS data across different time points and system configurations.

Conclusions:

  • The developed methods effectively correct artefacts in EELS data splicing.
  • Accurate quantitative comparison of EELS data is achievable with these corrections.
  • Principles are applicable to various spectrometers, including those with direct electron detectors.