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Updated: May 13, 2025

Lensfree On-chip Tomographic Microscopy Employing Multi-angle Illumination and Pixel Super-resolution
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Spatially coded wavelength-scanning lensless on-chip microscopy for pixel-super-resolved quantitative phase imaging.

Chengfei Guo, Haojie Ma, Jiayu Ding

    Optics Letters
    |April 15, 2025
    PubMed
    Summary

    A new spatially coded wavelength-scanning (scWS) method enables true quantitative phase imaging by encoding slow-varying phase information. This approach overcomes limitations of conventional techniques, improving phase profile restoration and image quality for advanced microscopy applications.

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    Area of Science:

    • Optical microscopy
    • Computational imaging
    • Phase retrieval

    Background:

    • Conventional wavelength-scanning phase retrieval struggles with low-frequency phase information.
    • Slow-varying phase data is not effectively converted to detectable intensity variations.

    Purpose of the Study:

    • To introduce a novel spatially coded wavelength-scanning (scWS) approach for accurate quantitative phase imaging.
    • To enable the restoration of low-frequency phase profiles, overcoming limitations of existing methods.

    Main Methods:

    • Implemented a spatially coded layer on an image sensor to encode phase information into intensity measurements.
    • Developed a reconstruction algorithm, inspired by coded ptychography, to recover both the object and the coded layer.
    • Utilized wavelength scanning combined with spatial-domain coded detection.

    Main Results:

    • Demonstrated successful quantitative phase recovery using both simulations and experiments.
    • Showcased accurate restoration of slow-varying phase profiles.
    • Achieved superior image quality compared to conventional wavelength-scanning methods.

    Conclusions:

    • The scWS method provides true quantitative phase imaging with improved phase profile restoration.
    • The developed lensless on-chip microscopy (LOM) platform offers potential for portable and in situ measurements.
    • This technique advances computational microscopy, particularly for field applications.