Related Experiment Video

Updated: May 13, 2025

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

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Ultra-low accelerating voltage scanning electron microscopy with multiple imaging detectors-imaging and analysis at

Kaoru Sato, Masayasu Nagoshi1, Takaya Nakamura1

  • 1Analysis and Characterization Division, JFE Techno-Research Corporation, 1-1 Minamiwatarida-Cho, Kawasaki 210-0855, Japan.

Microscopy (Oxford, England)
|April 16, 2025
PubMed
Abstract

Keywords:
X-ray microanalysisbackscattered electron imagescanning electron microscopysecondary electron imagesignal acceptance

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