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Toward Graphene Field-Effect Transistor Array with Uniform Sensing Characteristics via a Clean Graphene Transfer
Xiaoqing Qi1,2,3,4, Jingtao Chen1,2,3, Kaicong Liu2,3
1Center for Advanced Quantum Studies, Department of Physics, Capital Normal University, Beijing 100875, China.
ACS Sensors
|April 18, 2025
Summary
A novel lift-off resist (LOR) photoresist enables clean graphene transfer for electronic devices. This method overcomes challenges in large-scale graphene production, paving the way for advanced applications.
Area of Science:
- Materials Science
- Nanotechnology
- Surface Chemistry
Background:
- Large-scale synthesis of uniform, low-defect graphene on copper foil is advancing.
- Clean transfer of graphene to device substrates remains a significant challenge for practical applications.
Purpose of the Study:
- To develop and demonstrate a clean graphene transfer method using a lift-off resist (LOR) photoresist.
- To evaluate the surface cleanliness and device performance of graphene transferred with the LOR method.
Main Methods:
- Utilized a lift-off resist (LOR) photoresist as a transfer-supporting layer for graphene.
- Assessed graphene surface cleanliness using optical microscopy, atomic force microscopy, and Raman spectroscopy.
- Fabricated and tested high-throughput graphene field-effect transistors (GFETs) to evaluate sensing characteristics.
Main Results:
- Achieved a truly clean transfer of graphene, free from amorphous carbon residues like poly(methyl methacrylate).
- Surface analysis confirmed the high quality and uniformity of the transferred graphene.
- Demonstrated uniform sensing characteristics in GFETs fabricated with the cleanly transferred graphene.
Conclusions:
- The LOR photoresist method offers a novel and effective route for clean graphene transfer.
- This technique addresses a critical bottleneck in the industrial application of graphene.
- The clean transfer facilitates the development of high-performance graphene-based electronic devices.

