Enhancing resolution with the extended image restoration method: strain field energy and correlation length analysis...

Understanding atomic-level imperfections is crucial in various technological applications. Bragg coherent X-ray diffraction imaging (BCDI) enables non-destructive, three-dimensional imaging of those materials under in situ and operando conditions but has limited spatial resolution. This limitation hinders accurate calculations of physical quantities, e.g. strain field energy and strain correlation lengths. In this study, we introduce the extended image restoration (ExImRes) method, which infers enhanced resolution images based primarily on the process of averaging and combining multiple datasets obtained by restricting the original measured datasets through binning or cropping. We apply ExImRes to two nanocrystal examples-a chiral gold nanoparticle and a platinum nanoparticle-with an improved spatial resolution that allowed us to obtain precise calculation results of strain field energy and the correlation lengths of atomic deformations. The enhanced images reveal detailed lattice-scale information previously inaccessible through traditional BCDI methods. Our findings advance ExImRes to obtain high-resolution analysis in imaging techniques that involve reciprocal to real space transformations and understand underlying phenomena in materials science.