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Updated: May 10, 2025

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High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques
Published on: December 3, 2013
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An Efficient 3D Measurement Method for Shiny Surfaces Based on Fringe Projection Profilometry.
Hao Wei1,2, Hongru Li1, Xuan Li1
1College of Electronics and Information Engineering, Sichuan University, Chengdu 610065, China.
Sensors (Basel, Switzerland)
|April 28, 2025
Summary
This study introduces an efficient fringe projection profilometry (FPP) method for 3D measurement of shiny surfaces. It combines polarizers, deep learning, and dual-frequency decoding to enhance accuracy and efficiency.
Area of Science:
- Optical Metrology
- 3D Imaging
Background:
- Fringe projection profilometry (FPP) offers speed and accuracy but struggles with shiny surfaces due to fringe saturation.
- Shiny surfaces cause issues like fringe saturation or darkness, compromising 3D measurement accuracy.
Purpose of the Study:
- To develop an efficient and accurate FPP method for 3D measurement of shiny surfaces.
- To address the limitations of traditional FPP techniques when applied to specular surfaces.
Main Methods:
- Utilized polarizers to manage specular reflection and reduce fringe saturation.
- Employed a deep learning approach to enhance fringe quality in low-contrast areas.
- Introduced a dual-frequency complementary decoding method for efficient fringe order determination.
Main Results:
- Successfully alleviated fringe saturation on shiny surfaces using polarization.
- Improved fringe quality and measurement accuracy with deep learning enhancement.
- Achieved high-efficiency and high-dynamic-range 3D measurement with dual-frequency decoding.
Conclusions:
- The proposed method effectively overcomes challenges in 3D measurement of shiny surfaces using FPP.
- The combination of polarization, deep learning, and dual-frequency decoding offers a robust solution for accurate and efficient 3D profilometry.
Keywords:
complementary decodingfringe projection profilometryhigh dynamic rangespecular reflectionthree-dimensional measurement
