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FIB-SEM: Emerging Multimodal/Multiscale Characterization Techniques for Advanced Battery Development.

Zhao Liu^1,2, Shuang Bai^3,4,5, Sven Burke³

¹Thermo Fisher Scientific, 5350 NE Dawson Creek Drive, Hillsboro, Oregon 97124, United States.

Chemical Reviews

|May 1, 2025

Summary

This summary is machine-generated.

Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM) enables multiscale analysis of battery materials. This advanced technique is crucial for understanding and developing next-generation high-performance batteries.

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Area of Science:

Materials Science
Electrochemistry
Analytical Chemistry

Background:

Battery technology advancement requires understanding processes across multiple scales.
Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM) is vital for high-resolution battery research.
FIB-SEM allows analysis from macroscopic to nanoscale features.

Purpose of the Study:

To review the fundamentals and applications of FIB-SEM in battery research.
To explore FIB-SEM characterization of cathode, anode, and solid-state battery materials.
To highlight emerging FIB-SEM applications and AI integration for material characterization.

Main Methods:

Introduction to FIB-SEM instrumentation and beam-matter interaction.
Application review of FIB-SEM for rechargeable and solid-state batteries.
Discussion of analytical techniques (EDS, EBSD, SIMS) for detailed insights.

Main Results:

FIB-SEM provides detailed morphological, crystallographic, and chemical insights into battery materials.
Emerging applications include sample integrity workflows, in-operando characterization, and correlative microscopy.
AI integration enhances data analysis and predictive modeling for material characterization.

Conclusions:

FIB-SEM facilitates comprehensive multimodal and multiscale analysis of battery materials.
This technique is poised to significantly advance battery material understanding and development.
FIB-SEM is key to future innovations in high-performance battery technology.