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Updated: Jun 18, 2026

High-speed Particle Image Velocimetry Near Surfaces
Published on: June 24, 2013
Dual-frame interferometry with enhanced single-shot sensitivity using PIV equipment
1Plasma Physics Division, Naval Research Laboratory, Washington, District of Columbia 20375, USA.
Abstract:
A novel dual-frame interferometry technique was demonstrated and tested. The technique utilizes hardware typically used in particle image velocimetry measurements and demonstrates unprecedented single-shot sensitivity in noisy backgrounds. The phase extracted from the interferometry carried a systematic error, and a correction procedure was provided.
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