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MULTIXS: A new scanning multi-analyzer x-ray emission spectrometer at the GALAXIES beamline at synchrotron SOLEIL
James M Ablett1, Anthony Berlioux1, Dominique Prieur1
1Synchrotron SOLEIL, L'Orme des Merisiers, Départementale 128, 91190 Saint-Aubin, France.
Abstract:
We present the design and performance of a new multi-crystal x-ray emission spectrometer installed at the GALAXIES beamline at Synchrotron SOLEIL. The new instrument, which we name "MULTIXS," can host up to five analyzer crystals and supersedes our previous XES spectrometer design, providing a compact, simple design with all the analyzer crystals contained in the horizontal sample plane. This feature provides a direct view of the sample area and avoids the potential masking of the sample for constrained sample environments. This new design allows for the use of both 0.5 m and 1 m radius spherical analyzer crystals. In addition, the ability to continuously scan the spectrometer energy provides relatively fast scanning with high quality emission data and minimum dead-time overhead.
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