Related Experiment Video
Updated: May 17, 2025

Flame Experiments at the Advanced Light Source: New Insights into Soot Formation Processes
Published on: May 26, 2014
Development and Application of an Optoelectronic Sensor for Flame Monitoring of a Copper Concentrate Flash Burner
Gonzalo Reyes1, Walter Díaz1, Carlos Toro2
1Metallurgical Engineering Department, Universidad de Concepción, Concepción 4070386, Chile.
Abstract:
A flash smelting furnace operation is based on the exothermic reduction of copper concentrates in the combustion shaft, and these reactions occur at high temperatures (1250-1350 °C), where flame control is fundamental to optimizing copper reduction. Furthermore, inherent physicochemical reactions of the reduction process have been shown to emit spectral lines in the visible-near infrared spectrum (250-900 nm). Thus, an optoelectronic sensor prototype is proposed and developed for flame measurements of an industrial copper concentrate flash smelting furnace. The sensor system is composed of a high-temperature optical fiber probe, which functions as a waveguide to capture the emitted flame radiation and a visible-near infrared spectrometer. From the measured radiation, flame temperature and flame dynamics are analyzed. Flame temperature is estimated using the two-wavelength temperature estimation method, and flame dynamics are defined as variations in the total emissive power, which are studied in the time and frequency domain via the Fourier Transform method. These combustion dynamics are then used to create a flame instability index, which is used to characterize the flame combustion quality. The combination of this index and sensor platform provides a powerful tool to aid in proper flame control.
Related Concept Videos
Flame Photometry: Overview
Flame Photometry: Lab
Gas Chromatography: Types of Detectors-II
Atomic Fluorescence Spectroscopy
Gas Chromatography: Types of Detectors-I
TCD is the earliest and most widely used detector that operates by measuring the changes in the thermal conductivity of the carrier gas. When a sample compound enters the detector,...
Atomic Emission Spectroscopy: Interference

