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Related Experiment Video

Updated: May 16, 2026

Fabrication of Large-area Free-standing Ultrathin Polymer Films

Fabrication of Large-area Free-standing Ultrathin Polymer Films

Published on: June 3, 2015

Multi-Angle Averaging Approach for Measuring the Coating Thickness on Thin Transparent Polymer Films.

Friederike Münch¹, Benedikt Hauer¹, Ingo Breunig^1,2

¹Fraunhofer Institute for Physical Measurement Techniques IPM, Freiburg, Germany.

Applied Spectroscopy

|May 14, 2025

Summary

This summary is machine-generated.

Inline measurement of nanometer-thin oxide coatings on polymer films is now more precise. This new method overcomes interference effects from varying film thickness, ensuring accurate barrier function assessment.

Keywords:

IR‌Thin films infrared spectroscopy inline thickness measurement polymer web production control roll-to-roll coating systems silicon oxide

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Last Updated: May 16, 2026

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Area of Science:

Materials Science
Optical Engineering
Surface Science

Background:

Roll-to-roll coating systems apply nanometer-thin oxide layers to polymer films to enhance barrier properties like gas and water permeation.
Maintaining precise coating thickness is critical for effective barrier function, necessitating inline quality control.
Existing infrared reflection spectroscopy methods are challenged by interference effects from thin, weakly absorbing polymer substrates with variable thickness.

Purpose of the Study:

To develop and validate a novel sensing principle for accurate inline measurement of nanometer-thin oxide coating thickness on polymer films.
To address and overcome interference effects caused by variable polymer film thickness and backside reflections.
To enable precise quality control for oxide-coated polymer films used in barrier applications.

Main Methods:

Developed an infrared reflection measurement technique targeting specific oxide coating absorption bands.
Implemented an approach averaging interference patterns obtained at multiple angles of incidence to mitigate substrate variations.
Validated the method through calculations and measurements on industrial polymer film samples with oxide coatings.

Main Results:

The developed approach effectively measures oxide coating thickness on polymer films with varying substrates.
Achieved high precision ( nm) and accuracy ( nm) for coating thicknesses in the range of 5-100 nm.
Demonstrated the potential for implementation in versatile and compact inline measurement systems.

Conclusions:

Acoustic interferometry provides a robust solution for accurate inline thickness measurement of nanometer-scale oxide coatings on polymer films.
The multi-angle incidence approach effectively compensates for substrate thickness variations and backside reflections.
This technology is suitable for industrial inline quality control, ensuring the barrier performance of coated polymer films.