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Ali Al Dhaybi1, Jonas H Osório1,2, Foued Amrani3
1GPPMM Group, Xlim Research Institute, 123 Avenue Albert Thomas, Lim s 87060, France.
We developed a picometer-resolution optical profilometer to measure surface roughness in hollow-core photonic crystal fibers (HCPCFs). This device offers high sensitivity and a large dynamic range, crucial for advancing HCPCF technology.
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