Characterizing hollow-core fiber surface roughness with large dynamic range and picometer-resolution profilometry
Ali Al Dhaybi1, Jonas H Osório1,2, Foued Amrani3
1GPPMM Group, Xlim Research Institute, 123 Avenue Albert Thomas, Lim s 87060, France.
The Review of Scientific Instruments
|May 19, 2025
Summary
We developed a picometer-resolution optical profilometer to measure surface roughness in hollow-core photonic crystal fibers (HCPCFs). This device offers high sensitivity and a large dynamic range, crucial for advancing HCPCF technology.
Area of Science:
- Photonics
- Materials Science
- Optical Engineering
Background:
- Hollow-core photonic crystal fibers (HCPCFs) are critical for advanced optical applications.
- Accurate characterization of HCPCF surface roughness is essential for optimizing their performance.
- Existing methods may lack the resolution or dynamic range for comprehensive surface analysis.
Purpose of the Study:
- To design and characterize a novel optical profilometer.
- To achieve picometer resolution and a large dynamic range for surface roughness measurements.
- To demonstrate the profilometer's applicability to HCPCF microstructure analysis.
Main Methods:
- Development of a custom picometer-resolution optical profilometer.
- Characterization of the profilometer's sensitivity and dynamic range.
- Application of the profilometer to measure surface roughness within various HCPCF designs.
Main Results:
- Achieved a sensitivity of 2 pm/√Hz.
- Demonstrated a remarkable dynamic range of 1 cm.
- Successfully measured surface roughness inside different HCPCF structures.
Conclusions:
- The developed optical profilometer is validated for precise surface roughness assessment.
- The device offers unprecedented resolution and dynamic range for HCPCF analysis.
- This tool can be integrated into HCPCF development to enhance fabrication and performance.
