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Data-driven control in atomic force microscopy using a genetic algorithm.
Navid Asmari1, Lukas Neuner2, Richard Weiss2
1Ecole Polytechnique Fédérale de Lausanne, Lausanne, 1015, Switzerland.
Ultramicroscopy
|May 21, 2025
Summary
A new high-order linear controller enhances Atomic Force Microscopy (AFM) scanning speeds by improving vertical tracking. This controller cancels piezo-actuator resonances, enabling faster imaging of sample topographies.
Area of Science:
- Materials Science
- Nanotechnology
- Mechanical Engineering
Background:
- Atomic Force Microscopy (AFM) speed is limited by vertical motion tracking performance.
- Piezo-actuator resonances in AFM stages restrict achievable bandwidth and scan speed.
- Improving tracking performance is crucial for high-speed AFM operation.
Purpose of the Study:
- To develop a controller to overcome limitations in AFM scanning speed.
- To cancel lightly damped resonances in AFM piezo-actuators.
- To enhance the bandwidth of AFM nano-positioning stages.
Main Methods:
- A high-order linear controller was designed and implemented in series with a conventional PI controller.
- An optimization problem was formulated using the actuator's frequency response and desired performance.
- A genetic algorithm was employed to design the controller parameters.
Main Results:
- The proposed controller effectively cancels piezo-actuator resonances.
- Implementation demonstrated improved tracking bandwidth in AFM scanners.
- The controller enables higher achievable scan speeds for topographic imaging.
Conclusions:
- The developed high-order linear controller significantly enhances AFM scanning speed.
- This method provides a viable solution for pushing bandwidth limits in AFM systems.
- Optimized controller design is key to improving AFM performance and application scope.
