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Related Concept Videos

UV–Vis Spectroscopy of Conjugated Systems01:32

UV–Vis Spectroscopy of Conjugated Systems

Organic compounds with conjugated double bonds show strong absorption features in the UV–visible region of the electromagnetic spectrum attributed to π → π* electronic excitations. Generally, a UV–vis absorption spectrum is recorded as a plot of absorbance vs wavelength. The wavelength of maximum absorbance, which manifests as a peak in the absorption spectrum, is denoted as λmax.
One of the factors influencing λmax is the extent of conjugation in the...
UV–Vis Spectroscopy: Molecular Electronic Transitions01:16

UV–Vis Spectroscopy: Molecular Electronic Transitions

In Ultraviolet–Visible (UV–Vis) spectroscopy, the absorption of electromagnetic radiation is used to probe the electronic structure of molecules. This technique provides insights into molecular electronic transitions, particularly the movement of electrons between different molecular orbitals. Radiation is absorbed if the energy of the electromagnetic radiation passing through the molecule is precisely equal to the energy difference between the excited and ground states. During this process,...
UV–Vis Spectroscopy: Woodward–Fieser Rules01:29

UV–Vis Spectroscopy: Woodward–Fieser Rules

UV–Visible absorption spectra of conjugated dienes arise from the lowest energy π → π* transitions. The light-absorbing part of the molecule is called the chromophore, and the substituents directly attached to the chromophore are called auxochromes. A strong correlation exists between the absorption maxima, λmax, and the structure of a conjugated π system. The Woodward–Fieser rules predict the value of λmax for a given structure by adding the contributions...
Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.

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Related Experiment Video

Updated: Jun 14, 2026

Optical Scatter Microscopy Based on Two-Dimensional Gabor Filters
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Atom Identification in Bilayer Moiré Materials with Gomb-Net.

Austin C Houston1, Sumner B Harris2, Hao Wang3

  • 1Department of Materials Science and Engineering, The University of Tennessee, Knoxville, Tennessee 37996, United States.

Nano Letters
|June 2, 2025
PubMed
Summary
This summary is machine-generated.

A new deep learning model, Gomb-Net, can now identify atoms in individual layers of twisted bilayer materials, overcoming moiré pattern interference. This breakthrough allows for detailed atomic analysis previously impossible, revealing insights into material physics.

Keywords:
machine learningmoiré materialsscanning transmission electron microscopytwisted bilayers

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Deep Learning Applications

Background:

  • Moiré patterns in van der Waals (vdW) bilayer materials complicate atomic-resolution imaging.
  • Standard imaging techniques struggle to provide atomic-scale insight in the presence of moiré fringes.

Purpose of the Study:

  • To develop a method for detecting atom positions and identities in individual layers of twisted bilayer heterostructures.
  • To overcome the limitations imposed by moiré patterns on atomic-scale analysis.

Main Methods:

  • Development of a deep learning model named Gomb-Net.
  • Utilizing Gomb-Net to identify atomic coordinates and species, effectively deconvoluting moiré patterns.
  • Applying the method to analyze Se atom substitutional site distribution in twisted fractional Janus WS2-WS2(1-x)Se2x heterostructures.

Main Results:

  • Gomb-Net successfully identifies atomic positions and species in each layer, enabling layer-specific mapping.
  • The model deconvolutes complex moiré patterns, outperforming common segmentation models.
  • Layer-specific implantation sites of Se atoms were found to be unaffected by local moiré modulations.

Conclusions:

  • This advancement enables atom identification in complex material systems previously inaccessible.
  • The findings open new avenues for exploring material physics at the atomic scale.
  • Gomb-Net provides unprecedented layer-specific insights into vdW heterostructures.