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Related Experiment Video

Updated: Sep 19, 2025

$Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples$

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Reflection grating fabrication for the Rockets for Extended-source X-ray Spectroscopy.

Drew M Miles^1,2, Ross McCurdy², Michael Labella³

¹Physics, Math, and Astronomy, California Institute of Technology, 1200 E. California Blvd., Pasadena, CA 91125 USA.

Experimental Astronomy

|June 16, 2025

Summary

This summary is machine-generated.

The Rockets for Extended-source X-ray Spectroscopy (tREXS) mission fabricated high-efficiency soft X-ray gratings using advanced nanofabrication. These gratings achieve over 70% efficiency, crucial for studying extended cosmic sources.

Keywords:

Electron beam lithography Reflection gratings Suborbital rockets Substrate conformal imprint lithography X-ray gratings X-ray spectroscopy

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Area of Science:

X-ray astronomy
Astrophysical instrumentation
Nanofabrication

Background:

Soft X-ray spectroscopy is vital for studying extended astronomical sources.
Existing technologies faced limitations in grating efficiency and scalability.

Purpose of the Study:

To detail the nanofabrication of reflection gratings for the tREXS mission.
To demonstrate the production of high-efficiency gratings for soft X-ray spectroscopy.

Main Methods:

Electron-beam lithography (EBL) and KOH etching for master grating fabrication.
Substrate-conformal imprint lithography (SCIL) for mass replication of gratings.
Characterization of diffraction efficiency across the 0.18–0.8 keV band.

Main Results:

Achieved peak absolute diffraction efficiency >70% near 0.22 keV.
Demonstrated average absolute efficiency of ~50% across the 0.18–0.8 keV band.
Successfully replicated 191 gratings for the tREXS flight instrument.

Conclusions:

The developed nanofabrication and replication processes are suitable for producing high-performance X-ray gratings.
The tREXS gratings meet the requirements for sensitive soft X-ray spectroscopy of extended sources.
Future improvements can further enhance grating performance for astrophysical applications.