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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Viktoriia E Babicheva1, Chun-Chieh Chang2
1Department of Electrical and Computer Engineering, University of New Mexico, MSC01 1100, 1 University of New Mexico, Albuquerque, New Mexico 87131, United States.
This study enhances nonlinear metasurfaces using titania coatings applied via atomic layer deposition (ALD). This method boosts light confinement and nonlinear signal generation, particularly for telecommunication wavelengths.
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