Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Biasing of Metal-Semiconductor Junctions01:27

Biasing of Metal-Semiconductor Junctions

345
Biasing metal-semiconductor junctions involves applying a voltage across the junction. Specifically, the metal is connected to a voltage source, while the semiconductor is grounded. This technique is essential for controlling the direction and magnitude of current flow in electronic devices, including diodes, transistors, and photovoltaic cells.
In Schottky junctions, where the semiconductor is n-type, applying a positive voltage to the metal relative to the semiconductor reduces its Fermi...
345
Metal-Semiconductor Junctions01:24

Metal-Semiconductor Junctions

526
The contact of metal and semiconductor can lead to the formation of a junction with either Schottky or Ohmic behavior.
Schottky Barriers
Schottky barriers arise when a metal with a work function (Φm) contacts a semiconductor with a different work function (Φs). Initially, electrons transfer until the Fermi levels of the metal and semiconductor align at equilibrium. For instance, if Φm > Φs, the semiconductor Fermi level is higher than the metal's before contact. The...
526

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

A Systematic Review Investigating the Cytogenotoxic Effects of Isotretinoin.

Journal of applied toxicology : JAT·2026
Same author

Marine-Inspired Three-Dimensional Printed Biosilica-Spongin Scaffolds as Promoters of Osteogenic Differentiation and Gene Expression.

ACS applied bio materials·2026
Same author

3D-Printed Composite Scaffolds Containing SiO<sub>2</sub> for Bone Regeneration in <i>In Vivo</i> Models: A Systematic Review.

ACS omega·2026
Same author

Extracorporeal shockwave therapy in bone fractures: a systematic review.

Archives of orthopaedic and trauma surgery·2026
Same author

The Impact of Genetic Polymorphisms on Genotoxicity (DNA Damage) Among Children Exposed to Environmental Mutagens: A Systematic Review.

Journal of applied toxicology : JAT·2026
Same author

Bioactive chitosan scaffolds reinforced with hydroxyapatite and nickel tungstate for bone tissue engineering.

Biomaterials science·2026

Related Experiment Video

Updated: Sep 19, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

14.0K

Defect Engineering in Silver-Based Bimetallic Semiconductors: Recent Advances and Future Perspective.

Marcelo Assis1,2,3, Ana Claudia Muniz Rennó1, Juan Andrés2

  • 1Department of Biosciences, Federal University of São Paulo (UNIFESP), Santos, SP 11015-020, Brazil.

ACS Omega
|June 16, 2025
PubMed
Summary

This review explores how synthesis methods impact defects in silver-based bimetallic semiconductors like Ag2WO4, Ag2MoO4, and Ag2CrO4. Understanding defect engineering is key to enhancing material properties for advanced applications.

More Related Videos

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
12:18

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Published on: June 27, 2022

2.8K
In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
09:49

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx

Published on: May 13, 2020

4.2K

Related Experiment Videos

Last Updated: Sep 19, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

14.0K
Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
12:18

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Published on: June 27, 2022

2.8K
In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
09:49

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx

Published on: May 13, 2020

4.2K

Area of Science:

  • Materials Science and Engineering
  • Solid State Chemistry
  • Nanotechnology

Background:

  • Light-semiconductor interactions are fundamental to modern health, environmental, and energy technologies.
  • Silver-based bimetallic semiconductors offer enhanced properties driven by structural and electronic defects.

Purpose of the Study:

  • To review how synthesis modifications influence material properties, focusing on defect formation in silver-based bimetallic semiconductors.
  • To highlight the critical role of defect engineering in advancing material applications.

Main Methods:

  • Comprehensive literature review of synthesis strategies and their impact on defects.
  • Discussion of advanced characterization techniques: photoluminescence spectroscopy (PL), X-ray photoelectron spectroscopy (XPS), electron paramagnetic resonance (EPR), and positron annihilation lifetime spectroscopy (PALS).

Main Results:

  • Synthesis and postsynthetic modifications are crucial for controlling defect type, density, and distribution.
  • Precise control of defects remains challenging, necessitating a deeper understanding of synthesis-defect relationships.
  • Specific silver-based bimetallic semiconductors examined include Ag2WO4, Ag2MoO4, and Ag2CrO4.

Conclusions:

  • Defect engineering is essential for tailoring the physicochemical properties of silver-based bimetallic semiconductors.
  • Advanced characterization methods are increasingly vital for analyzing material defects.
  • Further research into synthesis-defect interplay will unlock improved material functionalities and applications.