Related Experiment Video
Updated: Sep 8, 2025

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
Published on: July 17, 2015
Self-Powered Ultraviolet-C Imaging Using Epitaxial Gallium Oxide Membranes with Anisotropic Domain Conduction
Byungsoo Kim1,2, Jae Young Kim1,3, Duyoung Yang1
1Department of Materials Science and Engineering, Research Institute of Advanced Materials, Seoul National University, Seoul 08826, Republic of Korea.
None:
High efficiency of charge carrier conduction is crucial for photoelectrical performance in ultraviolet C (UVC) photodetectors (PDs) based on heteroepitaxial beta-gallium oxide (β-Ga2O3) thin films. However, the presence of in-plane rotational domains due to anisotropic symmetry severely degraded the efficiency of charge carrier conduction by trapping and recombination of carriers in conventional lateral PD (LPD). Here, we demonstrate an approach that enables vertical conduction configuration while preserving the high crystallinity of epitaxial Si-doped β-Ga2O3 (Si:Ga2O3) through the epilayer transfer using a hole pattern sapphire nanomembrane (HPSN) growth template. Based on the characterization of domain orientation and photoresponsivity in transferred epitaxial Si:Ga2O3 membranes, we reveal the defect-related anisotropic conduction arising from the vertical interdomain and lateral intradomain conduction. Compared to the indirect intradomain pathway in LPD, the vertical PD (VPD) exhibited high efficiency of charge carrier conduction through the direct interdomain pathways. As a result, the self-powered VPD exhibits high rectifying characteristics with a high detectivity of 1.02 × 1013 Jones and a fast response time of 93 ms. Moreover, the multipixel UVC imaging PD arrays have been successfully demonstrated without any external applied bias, showing high recognition rates and practical utility for reliable UVC imaging applications. Our work not only demonstrates the feasibility of obtaining single-crystal epitaxial membranes for a wide range of material systems but also provides pathways for overcoming material limitations with defect-induced optoelectrical systems.

