Real-Time Tracking of Nanoscale Morphology and Strain Evolution in Bi2WO6 via Operando Coherent X-Ray Imaging

Jackson Anderson1, Nimish P Nazirkar1, Atoumane Ndiaye1

  • 1Department of Materials Science and Engineering, Rensselaer Polytechnic Institute (RPI), Troy, NY, 12180, USA.

Abstract