Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Types of Errors: Detection and Minimization01:12

Types of Errors: Detection and Minimization

2.7K
Error is the deviation of the obtained result from the true, expected value or the estimated central value. Errors are expressed in absolute or relative terms.
Absolute error in a measurement is the numerical difference from the true or central value. Relative error is the ratio between absolute error and the true or central value, expressed as a percentage.
Errors can be classified by source, magnitude, and sign. There are three types of errors: systematic, random, and gross.
Systematic or...
2.7K
Capacitor With A Dielectric01:18

Capacitor With A Dielectric

4.2K
Parallel plate capacitors consist of two conducting plates separated by a certain distance. However, it is mechanically difficult to hold the large plates parallel to each other without actual contact. Hence, a dielectric layer is commonly placed between the plates, which provides an easy solution for holding the plates together with a small gap and increases the capacitance of the capacitor.
Dielectrics are non-conducting materials with no free or loosely bound electrons. When a dielectric is...
4.2K
Detection of Gross Error: The Q Test01:00

Detection of Gross Error: The Q Test

6.4K
When one or more data points appear far from the rest of the data, there is a need to determine whether they are outliers and whether they should be eliminated from the data set to ensure an accurate representation of the measured value. In many cases, outliers arise from gross errors (or human errors) and do not accurately reflect the underlying phenomenon. In some cases, however, these apparent outliers reflect true phenomenological differences. In these cases, we can use statistical methods...
6.4K
Non-ohmic Devices00:51

Non-ohmic Devices

1.2K
In most substances, the current flow is proportional to the voltage applied to it. A simple relationship between the values of current, voltage, and resistance is known as Ohm's law. Nonohmic devices do not exhibit a linear relationship between voltage and current. One such device is the semiconducting circuit element known as a diode. A diode is a circuit device that allows current flow in only one direction.
Consider a simple circuit consisting of a battery, a diode, and a resistor. A...
1.2K
Electrostatic Boundary Conditions in Dielectrics01:27

Electrostatic Boundary Conditions in Dielectrics

1.4K
When an electric field passes from one homogeneous medium to another, crossing the boundary between the two mediums imparts a discontinuity in the electric field. This results in electrostatic boundary conditions that depend on the type of mediums the field propagates through.
Consider a case where both the mediums across a boundary are two different dielectric materials. Recall that the electric field and electric displacement are proportional and related through the material's...
1.4K
Semiconductors01:22

Semiconductors

929
There is variation in the electrical conductivity of materials - metals, semiconductors, and insulators that are showcased with the help of the energy band diagrams.
Metals such as copper (Cu), zinc (Zn), or lead (Pb) have low resistivity and feature conduction bands that are either not fully occupied or overlap with the valence band, making a bandgap non-existent. This allows electrons in the highest energy levels of the valence band to easily transition to the conduction band upon gaining...
929

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Electronic and optical properties of CrI<sub>3</sub>/Nb<sub>3</sub>Cl<sub>8</sub>heterojunction: a first principles investigation.

Journal of physics. Condensed matter : an Institute of Physics journal·2025
Same author

Overexpression of the lectin receptor-like kinase gene OsLecRK-S.7 inhibits plant growth and enhances disease resistance in rice.

Plant science : an international journal of experimental plant biology·2025
Same author

Management strategies for primary lung carcinosarcoma: a case study and comprehensive literature review.

Journal of cancer research and clinical oncology·2025
Same author

Biochemical assays for AID/APOBECs and the identification of AID/APOBEC inhibitors.

Methods in enzymology·2025
Same author

More done, more drained: Being further along in a mundane experience feels worse.

Journal of personality and social psychology·2025
Same author

The relationship between intradialytic hypotension and health-related quality of life in patients undergoing hemodialysis: a cross-sectional study.

Scientific reports·2025
Same journal

Research on a Regional Availability Evaluation Model for Road-Area High-Entropy Energy Based on Synergy Factors.

Entropy (Basel, Switzerland)·2026
Same journal

Atmospheric Turbulence Channel Modeling and Performance Analysis of a CO-ZP-OFDM Coherent Optical Communication System for UAV Air-to-Ground Scenarios.

Entropy (Basel, Switzerland)·2026
Same journal

Information Geometry and Asymptotic Theory for SMML Estimators.

Entropy (Basel, Switzerland)·2026
Same journal

Correlation Entropy and Power-Law Kinetics.

Entropy (Basel, Switzerland)·2026
Same journal

Research on the Contagion of Systemic Financial Risk Under the Impact of Climate Risks-From the Perspective of Complex Networks and Machine Learning.

Entropy (Basel, Switzerland)·2026
Same journal

The Statistical-Mechanical Meaning of the Wave Function of Quantum Mechanics.

Entropy (Basel, Switzerland)·2026
See all related articles

Related Experiment Video

Updated: Sep 18, 2025

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
11:34

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography

Published on: May 15, 2017

11.2K

Insulator Defect Detection in Complex Environments Based on Improved YOLOv8.

Yuxin Qin1,2, Ying Zeng3, Xin Wang1

  • 1School of Electrical and Information Engineering, Hunan University of Technology, Zhuzhou 412007, China.

Entropy (Basel, Switzerland)
|June 26, 2025
PubMed
Summary
This summary is machine-generated.

This study introduces an improved YOLOv8 network for detecting insulator defects, achieving high accuracy (98.6%) with a small model size (6.40 M) for power systems. The enhanced algorithm offers improved performance and practicality for edge devices.

Keywords:
C2f_DSC networkentropyfeature fusionimproved YOLOv8insulator defect detection

More Related Videos

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

14.0K
A 3D-printed Chamber for Organic Optoelectronic Device Degradation Testing
08:29

A 3D-printed Chamber for Organic Optoelectronic Device Degradation Testing

Published on: August 10, 2018

8.1K

Related Experiment Videos

Last Updated: Sep 18, 2025

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
11:34

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography

Published on: May 15, 2017

11.2K
Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

14.0K
A 3D-printed Chamber for Organic Optoelectronic Device Degradation Testing
08:29

A 3D-printed Chamber for Organic Optoelectronic Device Degradation Testing

Published on: August 10, 2018

8.1K

Area of Science:

  • Electrical Engineering
  • Computer Vision
  • Artificial Intelligence

Background:

  • Power system safety and stability rely on effective insulator defect detection.
  • Existing methods face challenges with accuracy, delay, and model size in complex environments.

Purpose of the Study:

  • To develop an improved YOLOv8 target detection network for insulator defects.
  • To enhance detection accuracy, reduce model size, and improve efficiency for complex environments.

Main Methods:

  • Proposed an improved YOLOv8 network incorporating a C2f_DSC feature extraction module.
  • Integrated EMA (encoder-modulator-attention) mechanism and BiFPN (bidirectional weighted feature pyramid network) fusion layer.
  • Utilized EIOU (efficient intersection over union) loss function for accelerated convergence.

Main Results:

  • Achieved a mean accuracy of 98.6% on the CPLID dataset, surpassing YOLOv8n by 0.8%.
  • Reduced model size to 6.40 M, demonstrating significant efficiency.
  • Outperformed other lightweight models (YOLOv8s, YOLOv6, YOLOv5s, YOLOv3Tiny) in both size and accuracy.

Conclusions:

  • The proposed algorithm offers a practical and feasible solution for insulator defect detection on edge devices.
  • The enhanced YOLOv8 network effectively addresses limitations of existing methods in complex scenarios.
  • The study highlights the potential for improved power system safety and operational stability.