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Related Concept Videos

Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
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Electron Microscope Tomography and Single-particle Reconstruction01:07

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Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
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Transmission Electron Microscopy01:15

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In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
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Scanning Electron Microscopy01:07

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Overview of Electron Microscopy01:25

Overview of Electron Microscopy

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The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
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Updated: Sep 17, 2025

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
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Phase Imaging Methods in the Scanning Transmission Electron Microscope.

Gabriel Sanchez-Santolino1, Laura Clark2, Satoko Toyama3

  • 1GFMC, Departamento de Física de Materiales & Instituto Pluridisciplinar, Universidad Complutense de Madrid (UCM), 28040 Madrid, Spain.

Nano Letters
|June 28, 2025
PubMed
Summary
This summary is machine-generated.

Scanning transmission electron microscopy (STEM) offers atomic-scale material insights. Advanced phase imaging techniques enhance STEM for exploring nanoscale phenomena and next-generation applications.

Keywords:
4D-STEMdifferential phase contrastphase imagingptychographyscanning transmission electron microscopy

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Area of Science:

  • Materials Science
  • Nanoscience
  • Physics

Background:

  • Scanning transmission electron microscopy (STEM) is crucial for nano and atomic-scale material characterization.
  • STEM combines Z-contrast imaging with spectroscopy for visualizing atomic structures, defects, and interfaces.
  • Understanding material properties and functionalities is key in advanced applications.

Purpose of the Study:

  • To review phase imaging methods in STEM.
  • To explore recent innovations in STEM phase imaging.
  • To highlight the impact of these advancements on nanoscience and applications.

Main Methods:

  • Differential phase contrast (DPC) imaging.
  • Electron ptychography.
  • Advanced STEM techniques for nanoscale imaging.

Main Results:

  • Phase imaging enhances STEM capabilities for detailed material investigation.
  • New methods enable direct imaging of electromagnetic fields.
  • High dose efficiency for beam-sensitive materials and 3D structural analysis are achieved.

Conclusions:

  • Innovations in STEM phase imaging are driving progress in nanoscience.
  • These techniques deepen material insights and enable next-generation applications.
  • Applications span electronics, energy storage, and catalysis.