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Updated: Sep 17, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Correction: Topological phase transition in monolayer 1T'-MoS2
Mohammad Mortezaei Nobahari1, Mahmood Rezaei Roknabadi2
1Department of Physics, Ferdowsi University of Mashhad, Mashhad, Iran. mortezaie.mm71@gmail.com.
No abstract available in PubMed .
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