Scalable Fabrication and Integration Strategies for Metal Halide Perovskite Direct X-Ray Detectors

Metal halide perovskites have emerged as promising materials in direct X-ray detection applications, due to their strong X-ray absorption ability, large carrier mobility-lifetime product, tunable band gaps, and low cost. In the past several years, X-ray detectors based on metal halide perovskite materials have exhibited exceptional detection performance, such as high sensitivity and low detection limits, and are attracting immense interest in academic and industrial fields. To meet the demands for low-dose, high-resolution, and fast-response X-ray imaging, the development of large-area, multi-pixel X-ray detector arrays is essential. Despite the rapid development of multi-pixel X-ray imaging technology based on perovskites, there is still room for improvement in imaging performance. This review introduces the principle, device architecture, and key performance parameters of direct X-ray imaging, with a focus on the issues of scalable fabrication of perovskites and their integration with pixelated electrode substrates for multi-pixel imaging. A series of scalable bottom-up and top-down fabrication methods for perovskite thick films and integration strategies is summarized. This review aims to provide an overview of the recent advances of perovskite-based direct-conversion X-ray detectors, and outline the challenges and their potential future directions in this field.