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High-Throughput Ellipsometric Contrast Microscopy of Lateral 2D Heterostructures for Optoelectronics

Teja Potočnik1, Oliver Burton1, Suman K Chakraborty2

  • 1Department of Engineering, University of Cambridge, 9 JJ Thompson Avenue, Cambridge, CB3 0FA, UK.

Small Methods
|July 9, 2025
PubMed
Abstract

Keywords:
2D materialscomputer visionellipsometric contrast microscopyhigh‐throughput characterizationlateral heterostructuresoptoelectronic devices

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