Contact line dynamics modulated by electrode roughness determines bubble detachment size

Weikang Yang1, Dongxu Gu2, Xin Liu1

  • 1School of Chemistry and Chemical Engineering, Chongqing University, Chongqing 400044, PR China. wkyang@stu.cqu.edu.cn.

Chemical Communications (Cambridge, England)
|July 10, 2025
PubMed