Difference from Background: Limit of Detection
The Electrical Double Layer
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: May 3, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Xiliang Zhang1,2, Yanwen Hu2,3, Shiwen Zhou2,3
1School of Physics and Electronics, Shandong Normal University, Jinan, China.
Researchers developed a new method for high-precision birefringence detection, reaching an accuracy of 10-11. This technique uses structured light to create a synthetic magnetic field, enabling enhanced measurements for optical applications.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: