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Updated: Sep 15, 2025

Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography
Published on: August 26, 2015
X‑ray Micro-Computed Tomography for Structural Analysis of All-Solid-State Battery at Pouch Cell Level
Chen-Jui Huang1,2, Jin An Sam Oh3, Marta Vicencio3
1Pritzker School of Molecular Engineering, University of Chicago, Chicago, Illinois 60637, United States.
Abstract:
Characterizing the microstructure of all-solid-state batteries (ASSBs) during fabrication and operation is vital for their advancement, particularly as scaling to pouch cell levels introduces challenges in probing large-scale microstructural evolution. This work highlights the potential of synchrotron X-ray micro-computed tomography (sXCT) as a nondestructive, rapid (<30 min), and high-resolution technique for visualizing and quantifying key microstructural features, including overhang, porosity, contact loss, active surface area, and tortuosity, in all-solid-state pouch cells. The large field of view (up to millimeters) of sXCT enables detailed analysis at an industry-relevant scale, bridging the gap between laboratory research and commercial applications. Furthermore, integrating realistic sXCT-derived 3D models into multiphysics simulations could provide insights into chemo-mechanical degradation, particularly at the edges of the pouch cells, offering a pathway for designing robust, high-performance ASSBs. This perspective establishes sXCT as an indispensable tool for advancing both the understanding and the engineering of next-generation energy storage systems.

