Related Experiment Video
Updated: Sep 14, 2025

Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity
Published on: March 6, 2017
Frequency dependence of complex permittivity of thick samples tested with an end-loaded cylindrical resonant cavity
Honglin Lu1, Chengyong Yu1, Yunpeng Zhang1
1School of Electronic Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China.
Abstract:
This paper presents a permittivity measurement system for materials using an improved end-loaded cylindrical resonator. Compared with the conventional cylindrical resonator cavity, the improved resonator expands the operating frequency by opening a slit at the top of the cavity. The resonator operates at 10-25 GHz with the TE01p (p = 1-9) operating mode and has a maximum Q-factor of 5.84 × 104, which provides good frequency selectivity. The system uses the field solution method to obtain the complex permittivity of the sample by extracting the resonance parameters of the sample before and after loading. The bottom of the cavity is designed as a sample stage that can be raised and lowered vertically to facilitate sample loading. In addition, the complex permittivity measurement of thick samples was successfully implemented in this system. The viability of the system is verified by testing typical thick samples (PTFE, quartz, etc.) in the range of 10-25 GHz. The presented method is of great importance for characterizing the dielectric frequency response properties of materials over a wide frequency range.
More Related Videos
Related Concept Videos
Parallel Resonance
Standing Waves in a Cavity
Susceptibility, Permittivity and Dielectric Constant
Characteristics of Series Resonant Circuit
Resonance in an AC Circuit
Sound Waves: Resonance

