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Terahertz Imaging and Characterization Protocol for Freshly Excised Breast Cancer Tumors

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Published on: April 5, 2020

Inversion method based on generalized plane wave spectrum in terahertz computed tomography.

Tianqi Feng¹, Chengyong Yu², Yu Shi¹

¹School of Integrated Circuit Science and Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China.

The Review of Scientific Instruments

|March 11, 2026

Summary

This summary is machine-generated.

This study introduces a new terahertz computed tomography (THz-CT) inversion method that accounts for corner scattering. The method improves reconstruction accuracy for various materials, enhancing nondestructive testing capabilities.

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Area of Science:

Physics
Electromagnetics
Imaging Science

Background:

Terahertz computed tomography (THz-CT) methods, derived from X-ray CT, typically use the Radon transform and assume straight-line propagation.
These traditional methods neglect terahertz wave scattering phenomena like refraction and corner scattering, leading to reconstruction inaccuracies.
Existing research often overlooks the significant impact of corner scattering on THz-CT performance.

Purpose of the Study:

To propose a novel THz-CT inversion method that incorporates corner scattering characteristics.
To address the discrepancies between theoretical plane wave assumptions and experimental Gaussian beam conditions.
To validate the proposed method's accuracy and feasibility for different material types.

Main Methods:

Development of an inversion algorithm based on the generalized plane wave spectrum to model corner scattering in layered structures.
Introduction of a field correction to reconcile theoretical plane wave analysis with experimental Gaussian beam conditions.
Experimental validation using a custom-built corner scattering field test system and comparison with the ordered subsets expectation maximization (OSEM) method.

Main Results:

The proposed inversion method accurately reconstructs terahertz computed tomography data, accounting for corner scattering.
Experimental comparisons with OSEM demonstrate superior accuracy for the proposed method.
The method shows high accuracy for PEC (perfect electric conductor) samples and feasibility for dielectric materials.

Conclusions:

The developed inversion method effectively handles corner scattering in THz-CT, improving reconstruction quality.
The field correction successfully bridges the gap between theoretical models and experimental setups.
This technique offers a more accurate and versatile approach for nondestructive testing using THz-CT, applicable to both conductive and dielectric materials.