Annealing-Driven Modifications in ZnO Nanorod Thin Films and Their Impact on NO₂ Sensing Performance

This research examines the effect of annealing temperature on the growth orientation of zinc oxide (ZnO) nanorods and its subsequent influence on NO₂ gas sensing efficiency. Zinc oxide (ZnO) nanorods were synthesized using the chemical bath deposition method, followed by annealing at 300, 400, and 500 °C. Diffraction analysis confirmed that both non-annealed and annealed ZnO nanorods crystallize in a hexagonal wurtzite structure. However, increasing the annealing temperature shifts the growth orientation from the c-axis (002) toward the (100) and (101) directions. Microscopy images (FE-SEM) revealed a reduction in nanorod diameter as the annealing temperature increases. Optical characterization using UV-visible and photoluminescence spectroscopy indicated shifts in the band gap energy and emission properties. Contact angle measurements demonstrated the hydrophobic nature of the films. Gas sensing tests at 200 °C revealed that the ZnO thin film annealed at 400 °C achieved the highest NO₂ response of 5.88%. The study highlights the critical role of annealing in modifying the crystallinity, growth orientation, and defect states of ZnO thin films, ultimately enhancing their NO₂ detection capability.