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Dinuclear aluminum complex as an active material for RRAM switching devices
Vivek Sharma1, Anupam Chetia2, Moumita Majumder3
1Department of Chemistry, Indian Institute of Technology Jodhpur, Rajasthan-342030, India. rkmetre@iitj.ac.in.
Dalton Transactions (Cambridge, England : 2003)
|July 30, 2025
Summary
We synthesized a dinuclear aluminum complex with a redox-active ligand, demonstrating its potential for resistive switching memory devices with stable analog data storage capabilities.
Area of Science:
- Coordination Chemistry
- Materials Science
- Nanotechnology
Background:
- Dinuclear aluminum complexes offer unique structural and electronic properties.
- Redox-active ligands are crucial for developing advanced electronic materials.
- Bis-catecholaldimine ligands provide versatile coordination environments for metal centers.
Purpose of the Study:
- To synthesize and structurally characterize a novel dinuclear aluminum complex.
- To investigate the electrochemical properties of the synthesized complex.
- To evaluate the potential of the complex as an active material in resistive switching memory devices.
Main Methods:
- Synthesis of the dinuclear aluminum complex using refluxing.
- Structural characterization via single-crystal X-ray diffraction.
- Electrochemical analysis using cyclic voltammetry.
- Fabrication and characterization of an ITO/complex 1/Ag resistive switching memory device.
- Density functional theory calculations for frontier molecular orbital energy.
Main Results:
- Successful synthesis and full structural elucidation of the dinuclear aluminum complex.
- Demonstration of redox activity through cyclic voltammetry.
- Fabrication of a memory device exhibiting stable current-voltage characteristics.
- Observation of analog switching between two resistance states for 5000 s.
- Theoretical calculations indicating favorable hole injection for device conduction.
Conclusions:
- The synthesized dinuclear aluminum complex is structurally well-defined and electrochemically active.
- The complex shows promise as a viable material for long-term data storage applications in resistive switching memory devices.
- Further research into the conduction mechanism and device optimization is warranted.
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