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Resonant scattering in low energy electron diffraction: Bi/Ni(111).

Bene Poelsema1, Martina Tsvetanova1, Harold J W Zandvliet1

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Summary
This summary is machine-generated.

Resonant scattering in Low Energy Electron Diffraction (LEED) provides new insights into thin film structures. This phenomenon, often overlooked, is crucial for accurate analysis of bismuth films on nickel surfaces.

Keywords:
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Area of Science:

  • Surface Science
  • Condensed Matter Physics
  • Materials Science

Background:

  • Low Energy Electron Diffraction (LEED) is a standard technique for surface structure determination.
  • Understanding thin film growth and structure is vital for materials science and nanotechnology.

Purpose of the Study:

  • To investigate the role of resonant scattering in LEED patterns of monolayer Bi films on Ni(111).
  • To explore the implications of resonant scattering for very low energy LEED-IV structural analysis.

Main Methods:

  • Low Energy Electron Diffraction (LEED) measurements were performed on a monolayer Bi film on Ni(111) up to 50 eV.
  • Analysis of intensity versus energy profiles of diffraction spots to identify resonant scattering phenomena.

Main Results:

  • Several unique diffraction spots exhibited finite intensity at well-defined energies, attributed to resonant scattering via image potential eigenstates.
  • Anomalously high intensity at the low energy side of regular spots was also linked to resonant scattering.
  • Analysis of the (0 2) peak indicated the presence of long, narrow, translationally shifted Bi film domains.

Conclusions:

  • Resonant scattering is a significant, often disregarded, phenomenon in very low energy LEED analysis.
  • The findings necessitate the consideration of resonant scattering for accurate structural determination of thin films.
  • The study reveals details about the domain structure of the Bi film on Ni(111).