Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle
Atomic Emission Spectroscopy: Lab
Atomic Emission Spectroscopy: Instrumentation
Inductively Coupled Plasma-Mass Spectrometry (ICP-MS): Interferences
Inductively Coupled Plasma–Mass Spectrometry (ICP–MS): Overview
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Updated: Sep 13, 2025

Emission Spectroscopic Boundary Layer Investigation during Ablative Material Testing in Plasmatron
Published on: June 9, 2016
Reagan Elia1, Thomas J Johnston1, Alberto D Figueroa1
1Department of Chemistry and Biochemistry, University of North Florida, Jacksonville, FL, 32224, USA.
Multi-wavelength internal standardization (MWIS) offers a novel approach to trace analyte determination, improving accuracy and throughput over existing multi-signal methods. This technique enhances calibration strategies for complex samples using inductively coupled plasma optical emission spectrometry (ICP-OES).
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