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Updated: Sep 12, 2025

Emission Spectroscopic Boundary Layer Investigation during Ablative Material Testing in Plasmatron
Published on: June 9, 2016
Andreas Werbrouck1, Philippe F Smet1, Dirk Poelman1
1Ghent University, Department of Solid State Sciences, Krijgslaan 281 S1, 9000 Ghent, Belgium.
Optical emission spectroscopy with non-negative matrix factorization (NMF) effectively characterizes atomic layer deposition (ALD) chemistry. This method identifies reaction products and addresses spurious signals for accurate in situ process monitoring.
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