Updated: Sep 12, 2025

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Xiaoqin Meng1,2,3,4,5, Zhen Chai1,2,3,4,5, Yuting Xu1,2,3,4,5
1Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, 100191, China. zhenchai@buaa.edu.cn.
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
This study presents a silicon nitride chip emitter for quantum applications. The device generates specific light patterns for optical pumping and laser stabilization in atomic systems.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: