Characterizing nanoscale spatiotemporal defects of multi-layered MoSe2 in hyper-temporal transient nanoscopy

Hwi Je Woo1, Sung-Gyu Lee2, Hansung Kim1

  • 1Material Property Metrology Group, Korea Research Institute of Standards and Science (KRISS), Daejeon 34113, Republic of Korea.

PubMed
Abstract