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Inducing memristive behavior to MoSe2/graphene bilayer using plasma treatment
Mohammad Salehi1,2, Seyed Majid Mohseni3, Parnia Bastani2
1Laser and Plasma Research Institute, Shahid Beheshti University, Tehran, 19839, Iran.
Scientific Reports
|August 7, 2025
Summary
Plasma treatments engineer defects in two-dimensional (2D) materials like MoSe2, inducing memory effects. This defect engineering creates novel memristive properties for advanced electronic components.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Nanotechnology
Background:
- Two-dimensional (2D) materials possess unique electronic band structures, enabling novel electronic device applications.
- Defects in 2D material lattices can be engineered to impart desirable electronic properties, such as memory effects.
- Plasma treatment is an efficient and selective technique for modifying 2D materials.
Purpose of the Study:
- To present plasma treatment as a versatile method for inducing memory effects in 2D materials through structural modifications.
- To investigate the memristive properties induced in Molybdenum Diselenide (MoSe2) layers via oxygen plasma treatment.
- To explore the origin of memristive behavior by analyzing structural and chemical changes.
Main Methods:
- Oxygen plasma treatment was applied to Molybdenum Diselenide (MoSe2) layers.
- Raman spectroscopy was employed to identify and characterize induced oxygen defects.
- Scanning electron microscopy (SEM) was used to observe geometrical modifications and exfoliation of 2D flakes.
Main Results:
- Oxygen plasma treatment successfully induced defects and geometrical modifications in MoSe2 layers.
- The structural modifications resulted in observable memristive properties within the treated MoSe2.
- Raman spectroscopy confirmed the presence of oxygen-related defects post-plasma treatment.
- SEM images revealed exfoliation and altered flake geometry in the MoSe2.
Conclusions:
- Plasma treatment is a viable method for inducing memristive behavior in 2D materials like MoSe2.
- The combination of induced oxygen defects and geometrical evolution is responsible for the observed memristive properties.
- The promising endurance signatures of the resulting memristive behavior make this method attractive for device manufacturing.

