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Stitching path optimization for a rough surface interference test.
Applied Optics
|August 12, 2025
Summary
Phase unwrapping for rough surfaces is improved using block processing and optimized stitching. This method significantly reduces global phase errors common in least-squares approaches for interferometry.
Area of Science:
- Optical Metrology
- Interferometry
- Image Processing
Background:
- Phase unwrapping is essential in phase-shifting interferometry, directly affecting measurement precision.
- The discrete cosine transform-based least-squares (DCT-LS) method is used for unwrapping rough surface interference data.
- DCT-LS can introduce global phase errors despite providing smooth results.
Purpose of the Study:
- To suppress error propagation in least-squares phase unwrapping.
- To improve the unwrapping results for rough surfaces using a novel stitching approach.
- To optimize the stitching path for enhanced accuracy.
Main Methods:
- Implemented a block phase unwrapping and stitching scheme.
- Developed an optimized stitching path planning method.
- Validated through simulations and experimental optical processing.
Main Results:
- The block phase unwrapping and stitching method significantly reduces global phase errors.
- Optimized stitching path planning yields superior unwrapping results compared to serpentine paths.
- The proposed method enhances the precision of phase measurement for rough surfaces.
Conclusions:
- Block phase unwrapping with optimized stitching effectively mitigates errors in DCT-LS.
- The optimized path planning is crucial for achieving accurate phase unwrapping of rough surfaces.
- This approach offers a more reliable solution for optical processing applications requiring precise phase measurements.
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