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    This study introduces formulas for second-order diffraction effects in optical radiometric measurements, aiding in improved measurement accuracy. These findings facilitate streamlined diffraction corrections for enhanced precision in scientific instruments.

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    Area of Science:

    • Optics and Photonics
    • Metrology

    Background:

    • Optical radiometric measurements are crucial for various scientific and industrial applications.
    • Diffraction effects can introduce significant errors in these measurements.
    • Accurate corrections for diffraction are essential for reliable data.

    Purpose of the Study:

    • To present formulas for the leading terms of second-order diffraction effects.
    • To compare these formulas with numerical calculation results.
    • To provide a basis for improving diffraction corrections in optical measurements.

    Main Methods:

    • Derivation of analytical formulas for second-order diffraction.
    • Comparison of derived formulas with results from numerical simulations.
    • Analysis of the leading terms contributing to diffraction errors.

    Main Results:

    • Formulas for second-order diffraction effects were successfully derived.
    • The presented formulas show good agreement with numerical calculations.
    • Identified key terms contributing to diffraction-induced radiometric errors.

    Conclusions:

    • The derived formulas offer a pathway to more accurate diffraction corrections.
    • Streamlined improvements in optical radiometric measurement accuracy are facilitated.
    • Potential for future research includes extending these corrections to higher orders.