Optimization of low-temperature spectral emissivity measurement scheme based on background factor evaluation

Area of Science:

• Physics
• Materials Science
• Metrology

Background:

• Accurate spectral emissivity is crucial for evaluating thermal emitter performance.
• Low-temperature emissivity measurements are difficult due to weak signals and background radiation.

Purpose of the Study:

• To develop and validate a novel measurement scheme for low-temperature spectral emissivity.
• To address challenges posed by weak radiation and background interference.

Main Methods:

• Combines radiation modulation technology with a background factor optimization algorithm.
• Systematically evaluates background factor influence using theoretical simulation and experimental validation.

Main Results:

• Successfully measured spectral emissivity of silicon carbide from 213-273 K.
• Achieved an expanded uncertainty of less than 0.01 for the measurements.

Conclusions:

• The presented scheme provides a reliable method for accurate low-temperature spectral emissivity measurements.
• Offers a guideline for researchers conducting similar measurements in challenging thermal environments.