Fringe projection profilometry using model-free distorted patterns.

Area of Science:

• Optics and Photonics
• Metrology
• Computer Vision

Background:

• Fringe projection profilometry (FPP) systems often rely on expensive projectors and explicit mathematical models.
• High-quality projector optics are a significant cost factor in current FPP systems.
• A need exists for cost-effective FPP solutions applicable to consumer electronics.

Purpose of the Study:

• To present a novel method for 3-D profilometry using model-free, distorted fringe patterns.
• To demonstrate that explicit mathematical models of projector optics are not necessary for accurate 3-D measurements.
• To enable the use of lower-cost projector designs in FPP systems.

Main Methods:

• Utilized distorted fringe patterns (circular and hyperbolic) without relying on their mathematical models.
• Performed 3-D shape measurements using these model-free distorted patterns.
• Evaluated the accuracy of the 3-D reconstruction by comparing results with a standard horizontal pattern.

Main Results:

• Achieved comparable root mean square errors (RMSE) for 3-D reconstruction using circular (0.047 mm) and hyperbolic (0.049 mm) patterns.
• The accuracy of the model-free distorted patterns is comparable to that of a standard horizontal pattern (0.036 mm RMSE).
• Demonstrated the feasibility of 3-D profilometry without explicit projector system models.

Conclusions:

• The proposed model-free distorted fringe pattern method significantly reduces requirements on projector optics quality.
• This technique opens possibilities for low-cost projector designs in fringe projection profilometry.
• The method is extensible to various aberrated and distorted fringe patterns, broadening FPP applications in cost-sensitive fields.