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    Area of Science:

    • Optical Microscopy
    • Microscope Instrumentation
    • Electrically Tunable Lenses

    Background:

    • Optical microscopy faces a resolution-depth of field (DOF) trade-off, limiting 3D sample observation to a few micrometers.
    • Mechanical scanning to increase DOF is slow and can cause vibrations in delicate samples.

    Purpose of the Study:

    • To propose a novel extended-DOF microscope design using an electrically tunable lens (ETL) to overcome the limitations of traditional microscopy.
    • To develop a compact microscope architecture capable of capturing extended depth image stacks.

    Main Methods:

    • An electrically tunable lens (ETL) based on electrowetting was integrated into a compact microscope setup.
    • Axial scanning was achieved through non-afocal coupling of two M12 lenses and the ETL.
    • The system was designed as a potential add-on module for commercial microscopes.

    Main Results:

    • The proposed extended-DOF microscope achieved a long depth range with constant magnification and resolution comparable to standard microscopes.
    • Spatial resolution remained invariant across the entire depth range.
    • The compact design maintained high optical performance.

    Conclusions:

    • The ETL-based extended-DOF microscope offers a viable solution for imaging thicker 3D samples without mechanical scanning.
    • The proposed system's compact and adaptable design allows for integration with existing microscopes, enhancing their capabilities.